Nanoscale Characterization of Escherichia coli Biofilm Formed under Laminar Flow Using Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM)
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Jeesun Lim Kang Mu Lee So Hyun Kim Seong Won Nam Yoo Jin Oh Hyun Sun Yun William Jo Sejong Oh Sae Hun Kim Sungsu Park
Vol. 29, No. 11, pp. 2114-0, Nov. 2008

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Cite this article
[IEEE Style]
J. Lim, K. M. Lee, S. H. Kim, S. W. Nam, Y. J. Oh, H. S. Yun, W. Jo, S. Oh, S. H. Kim, S. Park, "Nanoscale Characterization of Escherichia coli Biofilm Formed under Laminar Flow Using Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM)," Bulletin of the Korean Chemical Society, vol. 29, no. 11, pp. 2114-0, 2008. DOI: 10.5012/bkcs.2008.29.11.2114.
[ACM Style]
Jeesun Lim, Kang Mu Lee, So Hyun Kim, Seong Won Nam, Yoo Jin Oh, Hyun Sun Yun, William Jo, Sejong Oh, Sae Hun Kim, and Sungsu Park. 2008. Nanoscale Characterization of Escherichia coli Biofilm Formed under Laminar Flow Using Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). Bulletin of the Korean Chemical Society, 29, 11, (2008), 2114-0. DOI: 10.5012/bkcs.2008.29.11.2114.