Development of Multi-sample Loading Device for TEM Characterization of Hydroxyapatite Nanopowder 


Vol. 34,  No. 3, pp. 788-792, Mar.  2013
10.5012/bkcs.2013.34.3.788


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  Abstract

A shortcoming of using transmission electron microscopy (TEM) for structural analysis via electron diffraction is the relatively large error of the measurements as compared to X-ray diffraction. To reduce these errors, various internal standard methods from earlier studies have been widely used. We developed a new device to facilitate the application of internal standard methods in preparation of TEM grids used for nanopowder analysis. Through the application of a partial mask on the TEM grid, both the internal standards and the research materials can be loaded on the same grid. Through this process, we conducted a TEM analysis that compared synthetic hydroxyapatite (HAp) nanopowder to bone apatite from a bovine femur. We determined that the accuracy of the d-spacing measurements of the HAp and bone powders could be improved to better than 1% after statistical treatments of the experimental data. By applying a quarter mask, we loaded four different nanoparticles on a single TEM grid, with one section designated for the internal standard.

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  Cite this article

[IEEE Style]

J. Lee, J. Kim, J. Jeong, J. Kim, E. Lee, Y. Kim, "Development of Multi-sample Loading Device for TEM Characterization of Hydroxyapatite Nanopowder," Bulletin of the Korean Chemical Society, vol. 34, no. 3, pp. 788-792, 2013. DOI: 10.5012/bkcs.2013.34.3.788.

[ACM Style]

Jong-Moon Lee, Jung-Kyun Kim, Jong-Man Jeong, Jin-Gyu Kim, Eunji Lee, and Youn-Joong Kim. 2013. Development of Multi-sample Loading Device for TEM Characterization of Hydroxyapatite Nanopowder. Bulletin of the Korean Chemical Society, 34, 3, (2013), 788-792. DOI: 10.5012/bkcs.2013.34.3.788.

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ISSN(Print) 0253-2964
ISSN(Online) 1229-5949